In situ TEM investigation of dynamical changes of nanostructuresCHEN, L. J; WU, W. W.Materials science & engineering. R, Reports. 2010, Vol 70, Num 3-6, pp 303-319, issn 0927-796X, 17 p.Conference Paper

Prediction of the Nutrient Content in Dairy Manure Using Artificial Neural Network ModelingCHEN, L. J; CUI, L. Y; XING, L et al.Journal of dairy science. 2008, Vol 91, Num 12, pp 4822-4829, issn 0022-0302, 8 p.Article

A study on carrier-removal techniques in fringe projection profilometryQUAN, C; TAY, C. J; CHEN, L. J et al.Optics and laser technology. 2007, Vol 39, Num 6, pp 1155-1161, issn 0030-3992, 7 p.Article

Coherent control multiphoton processes in semiconductor saturable Bragg reflector with freezing phase algorithmCHEN, M. C; HUANG, J. Y; CHEN, L. J et al.Applied physics. B, Lasers and optics (Print). 2005, Vol 80, Num 3, pp 333-340, issn 0946-2171, 8 p.Article

Effects of stress on the formation and growth of nickel silicides in Ni thin films on (0 0 1)SiCHENG, L. W; LO, H. M; CHENG, S. L et al.Materials science & engineering. A, Structural materials : properties, microstructure and processing. 2005, Vol 409, Num 1-2, pp 217-222, issn 0921-5093, 6 p.Article

Hold time effects on low cycle fatigue behavior of HAYNES 230® superalloy at high temperaturesLU, Y. L; CHEN, L. J; KLARSTROM, D. L et al.Materials science & engineering. A, Structural materials : properties, microstructure and processing. 2005, Vol 409, Num 1-2, pp 282-291, issn 0921-5093, 10 p.Article

Vacancy ordering in self-assembled erbium silicide nanowires on atomically clean Si(001)TSAI, W. C; HSU, H. C; HSU, H. F et al.Applied surface science. 2005, Vol 244, Num 1-4, pp 115-119, issn 0169-4332, 5 p.Conference Paper

Cyclic deformation behavior of HAYNES® HR-120® superalloy under low-cycle fatigue loadingCHEN, L. J; LIAW, P. K; WANG, H et al.Mechanics of materials. 2004, Vol 36, Num 1-2, pp 85-98, issn 0167-6636, 14 p.Conference Paper

Effects of stress on the interfacial reactions of metal thin films on (0 0 1)SiCHENG, S. L; LO, H. M; CHENG, L. W et al.Thin solid films. 2003, Vol 424, Num 1, pp 33-39, issn 0040-6090, 7 p.Conference Paper

Low-cycle fatigue behavior of HAYNES® HR-120® alloyHE, Y. H; CHEN, L. J; LIAW, P. K et al.International journal of fatigue. 2002, Vol 24, Num 9, pp 931-942, issn 0142-1123Article

A study of cobra venom factor in ex vivo pig liver perfusion modelSHEN, S. Q; CHEN, G; CHEN, S et al.Transplantation proceedings. 2001, Vol 33, Num 7-8, pp 3860-3861, issn 0041-1345Article

Solid state amorphization in metal/Si systemsCHEN, L. J.Materials science & engineering. R, Reports. 2000, Vol 29, Num 5, pp 115-152, issn 0927-796XArticle

Enhancement of C-49 to C-54 TiSi₂ phase transformation on (001)Si with an ultrathin TiN seed layerPENG, Y. C; CHEN, L. J; HSIEH, W. Y et al.Applied surface science. 1999, Vol 142, Num 1-4, pp 336-340, issn 0169-4332Conference Paper

Formation of Gd oxide thin films on (111)SiCHEN, J. C; SHEN, G. H; CHEN, L. J et al.Applied surface science. 1999, Vol 142, Num 1-4, pp 120-123, issn 0169-4332Conference Paper

First-principles determinations of magneto-crystalline anisotropy and magnetostriction in bulk and thin-film transition metalsWU, R. Q; CHEN, L. J; SHICK, A et al.Journal of magnetism and magnetic materials. 1998, Vol 177-81, pp 1216-1219, issn 0304-8853, 2Conference Paper

Study of the load control system of a boiler turbogenerator unit based on an adaptive neural modelLÜ, J. H; CHEN, J. Q; XU, Z. G et al.Cybernetics and systems. 1996, Vol 27, Num 1, pp 61-76, issn 0196-9722Article

Transmission electron microscopy and X-ray diffraction investigation of phase formation and transition between Pd₂Si and PdSi in Pd thin films on (111)SiCHEN, J. F; CHEN, L. J.Materials chemistry and physics. 1995, Vol 39, Num 3, pp 229-235, issn 0254-0584Article

High-resolution transmission electron microscopy investigation of interfaces in metal-silicon systemsCHEN, L. J; LIANG, J. M; LIU, C. S et al.Ultramicroscopy. 1994, Vol 54, Num 2-4, pp 156-165, issn 0304-3991Article

Suppression of the boron penetration induced Si/SiO2 interface degradation by using a stacked-amorphous-silicon film as the gate structure for pMOSFETSHYE LIN WU; CHUNG LEN LEE; TAN FU LEI et al.IEEE electron device letters. 1994, Vol 15, Num 5, pp 160-162, issn 0741-3106Article

Electrical and microstructural characteristics of Ti contacts on (001)SiLIAUH, H. R; CHEN, M. C; CHEN, J. F et al.Journal of applied physics. 1993, Vol 74, Num 4, pp 2590-2597, issn 0021-8979Article

Epitaxial growth of Cu thin films on atomically cleaned (111)Si at room temperatureLIU, C. S; CHEN, S. R; CHEN, W. J et al.Materials chemistry and physics. 1993, Vol 36, Num 1-2, pp 170-173, issn 0254-0584Article

Interfacial reactions of ultrahigh-vacuum-deposited Cu thin films on atomically cleaned (111)Si. I: Phase formation and interface structureLIU, C. S; CHEN, L. J.Journal of applied physics. 1993, Vol 74, Num 9, pp 5501-5506, issn 0021-8979Article

Influence of contact treatments on the electrical characteristics of shallow-junction titanium-based contactsLIAUH, H. R; TSENG, M. F; CHEN, M. C et al.Solid-state electronics. 1992, Vol 35, Num 6, pp 779-783, issn 0038-1101Article

Growth kinetics of amorphous interlayers by solid-state diffusion in polycrystalline Zr and Hf thin films on (111)SiCHENG, J. Y; CHEN, L. J.Journal of applied physics. 1990, Vol 68, Num 8, pp 4002-4007, issn 0021-8979, 6 p.Article

Direct observation of discrete layers of dislocation loops near the projected ion ranges in high-dose P⁺-implanted (001)Si by cross-sectional transmission electron microscopyHSU, S. N; CHEN, L. J; CHAO, W. Y et al.Applied physics letters. 1989, Vol 55, Num 6, pp 565-567, issn 0003-6951, 3 p.Article